Multiplexable fiber-optic strain sensor system with temperature compensation capability

ABSTRACT

A fiber optic sensor comprises two independent fibers having Bragg gratings which are coupled to commutating broadband optical sources through splitters and wavelength discriminators. The ratio of detected optical energy in each of two detectors examining the wave intensity returned to a wavelength discriminator coupled with the characteristic of the wavelength discriminator determines the wavelength returned by the grating. In another embodiment, tunable filters are utilized to detect minimum returned wave energy to extract a sensor wavelength. Reference to the original grating wavelength indicates the application of either temperature or strain to the grating. In another embodiment, a plurality of Bragg grating sensor elements is coupled to sources and controllers wherein a dimensional change in a fiber having a Bragg grating is detected using a measurement system comprising broad-band sources, optical power splitters, a high-sensitivity wavelength discriminator, optical detectors, and a controller.

This invention was made with U.S. Government support under grant NAS 1-20579 awarded by the National Aeronautics and Space Administration. The U.S. Government has certain rights in this invention.

FIELD OF THE INVENTION

The current invention applies to the field of fiber-optic sensors, wherein a dimensional change in a fiber having a Bragg grating is detected using a measurement system comprising broad-band sources, optical power splitters, a high-sensitivity wavelength discriminator, optical detectors, and a controller.

BACKGROUND OF THE INVENTION

There are several modern methods for fabricating optical waveguides for the low-loss containment and delivery of optical waves. One such waveguide is optical fiber which typically comprises an inner glass core surrounded by a glass cladding and a protective plastic jacket. Guidance of electromagnetic waves is achieved by the core having a slightly higher index of refraction than the surrounding cladding. Typical values for the core diameter are of order 10 μm for single-mode fiber operating at communications wavelengths of 1300-1550 nm, and 50 μm or 62.5 μm for highly multi-mode fiber. Whether single-mode or multi-mode, the cladding diameter has most commonly an overall diameter of 125 μm, and a plastic jacket diameter is typically 250 μm for standard telecommunications fiber. The glass core is generally doped with germanium to achieve a slightly higher index of refraction than the surrounding cladding by a factor of roughly 1.003. The jacket is generally plastic and is used to protect the core and cladding elements. It also presents an optically discontinuous interface to the cladding thereby preventing coupling modes in the cladding to other adjacent fibers, and usually plays no significant part in the optical behavior of the individual fiber other than the usually rapid attenuation of cladding modes in comparison with bound core modes.

As described in the book by Snyder and Love entitled “Optical Waveguide Theory” published by Chapman and Hall (London, 1983), under the assumptions of longitudinal invariance and small index differences for which the scalar wave equation is applicable, the modal field magnitudes may be written

Ψ(r,ψ,z)=Ψ(r,ψ)exp {i(βz−ωt)}

where

β is the propagation constant

ω is the angular frequency

t is time

z is the axial distance

r,ψ is the polar trans-axial position along the fiber.

Single-mode fibers support just one order of bound mode known as the fundamental-mode which we denote as ψ₀₁, and which is often referred to in the literature as LP₀₁. The transverse field dependence for the fundamental-mode in the vicinity of the core may be approximated by a gaussian function as

ψ₀₁(r,ψ)=exp {−(r/r ₀₁)²}

where r₀₁ is the fundamental-mode spot size.

Optical fiber couplers, also known as power splitters, are well known in the art, and generally comprise two fibers as described above having their jackets removed and bonded together with claddings reduced so as to place the fiber cores in close axial proximity such that energy from the core of one fiber couples into the core of the adjacent fiber. One such coupler is a fused coupler, fabricated by placing two fibers in close proximity, and heating and drawing them. The finished fused coupler has the two cores in close proximity, enabling the coupling of wave energy from one fiber to the other. A further subclass of fused coupler involves a substantially longer coupling length, and is known as a wavelength discriminator. The characteristics of a wavelength discriminator include wavelength-selective coupling from an input port to a first output port, as well as a second output port. As the wavelength is changed over the operating range of the wavelength discriminator, more energy is coupled into the first output port, and less is coupled into the second output port. The operation of a wavelength discriminator is described in “All-fibre grating strain-sensor demodulation technique using a wavelength division coupler” by Davis and Kersey in Electronics Letters, Jan. 6, 1994, Vol. 30 No. 1.

Fiber optic filters are well known in the art, and may be constructed using a combination of optical fiber and gratings. Using fiber of the previously described type, there are several techniques for creating fiber optic gratings. The earliest type of fiber grating-based filters involved gratings external to the fiber core, which were placed in the vicinity of the cladding as described in the publication “A single mode fiber evanescent grating reflector” by Sorin and Shaw in the Journal of Lightwave Technology LT-3:1041-1045 (1985), and in the U.S. patents by Sorin U.S. Pat. No. 4,986,624, Schmadel U.S. Pat. No. 4,268,116, and Ishikawa U.S. Pat. No. 4,622,663. All of these disclose periodic gratings which operate in the evanescent cladding area proximal to the core of the fiber, yet maintain a separation from the core. A second class of filters involve internal gratings fabricated within the optical fiber itself. One technique involves the creation of an in-fiber grating through the introduction of modulations of core refractive index, wherein these modulations are placed along periodic spatial intervals for the duration of the filter. In-core fiber gratings were discovered by Hill et al and published as “Photosensitivity in optical fiber waveguides: Application to reflected filter fabrication” in Applied Physics Letters 32:647-649 (1978). These gratings were written internally by interfering two counter propagating electromagnetic waves within the fiber core, one of which was produced from reflection of the first from the fiber end face. However, in-core gratings remained a curiosity until the work of Meltz et al in the late 1980s, who showed how to write them externally by the split-interferometer method involving side-illumination of the fiber core by two interfering beams produced by a laser as described in the publication “Formation of Bragg gratings in optical fibers by a transverse holographic method” in Optics Letters 14:823-825 (1989). U.S. patents Digiovanni U.S. Pat. No. 5,237,576 and Glenn U.S. Pat. No. 5,048,913, also disclose Bragg gratings, a class of grating for which the grating structure comprises a periodic modulation of the index of refraction over the extent of the grating. Short-period gratings reflect the filtered wavelength into a counter-propagating mode, and, for silica based optical fibers, have refractive index modulations with periodicity on the order of a third of the wavelength being filtered. Long-period gratings have this modulation period much longer than the filtered wavelength, and convert the energy of one mode into another mode propagating in the same direction, i.e., a co-propagating mode, as described in the publication “Efficient mode conversion in telecommunication fibre using externally written gratings” by Hill et al in Electronics Letters 26:1270-1272 (1990). The grating comprises a periodic variation in the index of refraction in the principal axis of the core of the fiber, such variation comprising a modulation on the order of 0.1% of the refractive index of the core, and having a period associated with either short or long-period gratings, as will be described later.

The use of fiber-optics in temperature measurement is disclosed in U.S. Pat. No. 5,015,943 by Mako et al. A laser source is beam split into two fibers, one of which is a sensing fiber exposed to an elevated temperature, and one of which is a reference fiber in an ambient environment. The optical energy from the two fibers is summed together, and an interference pattern results. As the temperature changes, the physical length of the sensing fiber optic cable changes, which causes the interference pattern to modulate. Each modulation cycle represents one wavelength change in length. Counting these interference patterns over time enables the measurement of temperature change.

SUMMARY OF THE INVENTION

The present invention is directed to an apparatus for the measurement of sensor grating pitch, wherein the change in grating pitch can originate from a strain applied to the sensor grating, or it may originate from a temperature change wherein the sensor grating expands or contracts due to the coefficient of thermal expansion of the optical fiber enclosing the sensor grating. A pair of fibers, each having a sensor grating, is illuminated by a pair of broadband sources coupled through a pair of optical power splitters, and this sensor grating reflects wave energy over a narrow optical bandwidth. Reflected wave energy from the narrow-band sensor grating is passed through a wavelength discriminator, comprising a long-drawn optical coupler. A normalized power ratio comprises the difference in first and second detector power levels divided by the sum of the first and second power level. This intensity ratio is compared to the wavelength discriminator characteristic stored in a controller to look up the wavelength from a normalized power ratio value, and hence the pitch of the sensor grating. As the characteristic of the wavelength discriminator is essentially temperature invariant, this very accurately yields the sensor grating pitch. Comparing this reflected wavelength to the known wavelength of the grating indicates a change in wavelength brought about by either a temperature change or by the presence of a strain. In the case where a second sensor is also monitored, one sensor may be used as a reference to monitor the temperature of the second sensor, which is used to measure applied strain. In this manner, the temperature effect of the strain gauge may be cancelled by using the measured result of the reference sensor. Commutating the two sources in separate non-overlapping intervals enables the independent measurement of temperature, or strain, or any combination of the two.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1a is a prior art grating.

FIGS. 1b, c, d show the spectral behavior of the prior art grating of FIG. 1a.

FIG. 1e is a prior art coupler/wavelength discriminator

FIG. 1f is a section view of the fused area of FIG. 1e.

FIG. 2 is a block diagram of the fiber optic sensor system.

FIG. 3 is a block diagram of the controller of FIG. 2.

FIG. 4 is a wavelength discriminator.

FIG. 5 is a graph of the response of a wavelength discriminator including reflected grating power applied to this wavelength discriminator.

FIG. 6 is a graph of the output function of the wavelength discriminator normalized power ratio (P1−P2)/(P1+P2).

FIG. 7 is the dynamic state of various internal nodes of the fiber optic sensor system during operation.

FIG. 8 is a three-wavelength, temperature/strain sensor.

FIG. 9 shows the wavelength detection properties of FIG. 8.

FIG. 10 is a multi-wavelength strain/temperature measurement system.

FIG. 11 is an alternate wavelength detector for FIG. 10.

FIG. 12 is a multi-wavelength strain/temperature measurement system using tunable gratings.

FIG. 13 shows the voltage waveforms for FIG. 12.

FIG. 14 shows a temperature/strain measurement system having an alternate wavelength discriminator comprising a broadband grating and a splitter.

FIG. 15 shows the block diagram of the measurement controller of FIG. 14.

FIG. 16 shows the input to the first and second detectors versus wavelength for the measurement system of FIG. 14.

FIG. 17 shows a temperature/strain measurement system using a wavelength discriminator comprising a coarse wavelength discriminator and a fine wavelength discriminator.

FIG. 18 shows the characteristic transfer function for the fine wavelength discriminator and the coarse wavelength discriminator of FIG. 17.

DETAILED DESCRIPTION OF THE INVENTION

FIG. 1a shows a prior art internal grating filter, comprising an optical fiber having a core 1, a cladding 2, and a grating 3 fabricated within the extent of the core 1. The grating 3 comprises a modulation of the index of refraction of core 1 having a regular pitch 4, where the grating 3 is used to create short-period grating behavior. For reflection of waves through the grating at wavelength λ_(b), the short-period grating function is as follows:

Λ_(b)=λ_(b)/2n

where

Λ_(b)=pitch of the desired Bragg grating,

λ_(b)=conversion wavelength: For short period gratings, λ_(b) is the wavelength for which incident fundamental mode wave energy is converted to counter-propagating (traveling in the opposite direction) wave energy.

n=effective index of refraction of the fiber, which is dependant on the mode of the propagated wave.

Examining now the transfer curves for a short-period grating 3, FIG. 1b shows the input source spectrum 7 applied to port 5, and FIG. 1c shows the reflected spectrum 8 and grating peak 9 reflected back to port 5. FIG. 1d shows the remaining optical energy continuing to port 6. Filter notch 11 represents wave energy reflected by the short period Bragg grating back to the input port 5, and is represented as spectrum 8 having peak 9 corresponding to the Bragg wavelength. The use of reflected wave energy at peak 9 is generally not available without the use of an optical coupler or some other device sensitive to the propagating direction of this wave.

FIG. 1e shows a prior art optical coupler. First fiber having a core 12 and cladding 13 is placed in proximity with a second fiber having a core 15 and a cladding 14. Together, these fibers are heated and drawn to fuse the two fibers into one having a coupling length 16. FIG. 1f shows a section view of this fused middle section. Coupling length 16 and separation 17 determine the coupling characteristics of the coupler. If the coupling length 16 is short, a broadband coupler having a coupling coefficient related to separation 17 is formed. This is the typical construction for power splitter configurations. If the length 16 is many wavelengths long, a narrowband coupler is formed, also known as a wavelength discriminator. The characteristics of a wavelength discriminator are similar to those of a coupler, with an additional wavelength dependence, as shown in FIG. 5, which is described later.

FIG. 2 shows the present fiber-optic sensor. Measurement system 20 is coupled to fibers 45 and 51. Each of fibers 45 and 51 has a Bragg grating 46 and 52 respectively. Measurement system 20 further comprises a controller 22 having a first source enable output 24 coupled to first source 36, which may be any source of optical energy having a spectrum which includes the wavelength of the grating 46 on fiber 45. A broadband light-emitting diode (LED) would provide an inexpensive broadband source. Similarly, second source enable output 26 is coupled to second source 40, which has the same requirement of including in its output spectrum the wavelengths of the grating 52 of fiber 51. Broadband sources 36 and 40 respectively couple energy through standard power splitters 42 and 44, which provide optical energy to gratings 46 and 52 respectively. The gratings 46 and 52 may be internal Bragg gratings or external short period gratings. The short-period grating has the property of reflecting optical energy at the grating wavelength back to couplers 42 and 44, where it is split into optical energy provided to cables 41 and 43 to wavelength discriminator 38, the operation of which will be discussed later in FIG. 4. Output wave energy from wavelength discriminator 38 is separated into a first output on fiber 31 travelling to first detector 30, which provides a voltage 28 proportional to the input optical level delivered on fiber 31. Similarly, optical wave energy from the second output 33 of wavelength discriminator 38 is delivered to the second detector 34, which produces a voltage 32 to controller 22 proportional to the input optical level delivered on fiber 33.

FIG. 3 describes in detail the controller 22 of FIG. 2. Controller 22 further comprises a microprocessor 78 which produces first source enable output 24 and second source enable output 26. In addition, first detector input 28 and second detector input 32 are processed by buffer amplifiers 62 and 64 respectively, which isolate the detector element from the following electronics, and produce respectively outputs 82 and 84. These are processed by a difference amplifier 66 to produce a difference output at 86, which is converted from an analog signal to a digital signal by A/D converter 74, delivering a digital representation 90 of this signal to microprocessor 78. Amplifier 68 produces a detector sum output 88, which is similarly converted to a digital signal 92 by A/D converter 76, which is also input to microprocessor 78. A keypad 72 for input and a display 70 are also coupled to the microprocessor 78, as is an auxiliary interface 80. Microprocessor 78 may be chosen from several available units, including the PIC16C71 from Micro-Chip, Inc. of Chandler, Ariz., which has the A/D converters 74 and 76 incorporated internally. As is clear to one skilled in the art, many microprocessor choices are available for 78, including devices with internal or external ROM, RAM, A/D converters, and the like, of which many candidates from the Micro-Chip PIC-16 family would be suitable. While a particular microprocessor is shown for illustrative purposes, it is clear to one skilled in the art that other units could be substituted for these devices without changing the operation of the sensor. The principal requirements of microprocessor 78 are the ability to control the first and second sources, and to process the values provided by the first and second detectors in a manner which determines the wavelength of the sensor grating.

FIG. 4 shows the wavelength discriminator 38. The wavelength discriminator has a first splitter input port 41, a second splitter input port 43, a first detector output port 31, and a second detector output port 33. FIG. 5 shows the normalized output of wavelength discriminator 38 for the case where a swept-wavelength input is applied to first splitter input 41, and no input is provided to second splitter input 43. Curve 100 shows the output level of first detector output 31, while curve 104 shows the output level of second detector output 33. As can be seen from the graph, as the wavelength is varied from 1300 nm to 1316 nm, the first detector and second detector outputs vary in a complimentary manner, such that the sum of the first detector output and second detector output is nearly constant. The wavelength discriminator is a symmetric device, so if no optical signal were applied to first input 41 and a swept wavelength optical signal were applied to second input 43, curve 100 would show the level of second output port 33, while curve 104 would show the level of first output port 31.

FIG. 6 shows a plot for normalized power ratio derived from first output curve 100 and second output curve 104. If these two complimentary curves 100 and 104 are plotted as (P1−P2)/(P1+P2), then the plot of FIG. 6 results, and we may now determine wavelength over monotonic regions such as from 1304 nm to 1312 nm by simply looking up the wavelength given the (P1−P2)/(P1+P2) normalized power ratio. Curve 114 represents the response to first source 36, and curve 112 represents the response to second source 40. The advantage of performing this lookup in this ratiometric manner of FIG. 6 as opposed to the absolute output level on the curve 100 of FIG. 5 is that variations in source power are normalized out of the result. Specifically, changes in the output power of sources 36 and 40 would modulate the values shown in plots 100 and 104 of FIG. 5, but not the normalized power ratio shown in the plot of FIG. 6.

Further examining the operation of the measurement system of FIG. 2, the first measurement is performed with only first source 36 enabled. Optical energy travels through first coupler 42 to fiber 45, and to grating 46. Optical energy at the wavelength λ₁ of grating 46 is reflected through fiber 45 back to first coupler 42, through fiber 41, where it is presented to wavelength discriminator 38. No input is present on fiber 43 because second source 40 is not enabled. Optical energy from grating 46 is reflected, for example, at λ₁=1309 nm, as shown in curve 102 of FIG. 5, and 0.4 volts is generated at 28 by first detector 30. The second output 33 of wavelength discriminator 38 is applied to the second detector 34, producing 0.6 volts at 32 as shown in curve 103 of FIG. 5. By now finding the normalized power ratio of (0.4−0.6)/(0.4+0.6)=−0.20, it can be seen that this corresponds to 1309 nm wavelength on curve 114 at point 109 in FIG. 6.

An entirely separate measurement can be made by disabling first source 36 and enabling second source 40. In this case, optical energy would leave second splitter 44 through fiber 51 to grating 52. Optical energy at wavelength λ₂ 52 would be returned to second splitter 44 through fiber-optic cable 51, leave second splitter 44 through fiber-optic cable 43, entering wavelength discriminator 38. Analogous to the earlier described processing, first source 36 would be disabled, hence no optical energy would be present in fiber 41. In the case of wave energy input to fiber 43 instead of fiber 41, the output characteristic of FIG. 5 would be reversed such that curve 100 would be the output energy on fiber 33, and curve 104 would represent the output energy of fiber 31. If the grating 52 were reflecting at λ₂=1306 nm, then second detector 34 would produce 0.75 volts as shown in curve 108 of FIG. 5. First detector 30 would produce 0.25 volts as shown in curve 106 of FIG. 5. The normalized power ratio of FIG. 6 would be (0.25−0.75)/(0.25+0.75)=−0.5, corresponding to 1306 nm on curve 112 of FIG. 6 at point 107.

FIG. 7 shows the sensor measurement system operating in the earlier-described case where the wavelength of first sensor 46 is λ₁=1309 nm and the wavelength of second sensor 52 is λ₂=1306 nm. First, the detector offsets are determined by turning both first source 36 and second source 34 off. This produces the detector offset values OS1 and OS2, which will be necessary to subtract from the power difference and power sum before calculation of the normalized power ratio (P1−P2)/(P1+P2). Thereafter, first source 36 and second source 40 are alternately enabled as shown in FIG. 7. First detector 30 and second detector 34 produce the P1 and P2 values shown, and the difference, sum, and the normalized power ratio value of difference/sum are computed as shown, wherein the power difference (P1−P2) and the sum (P1+P2) represent power quantities after removal of offsets OS1 and OS2, which thereafter form the normalized power ratio (P1−P2)/(P1+P2). If the plot of FIG. 6 normalized power ratio were kept in the memory of the microprocessor, either as a series of interpolated points, or as a power series wherein only the coefficients f0, f1, f2, f3 . . . fn of a polynomial are stored, and the power series is of the form ${\lambda \left( {{P1},{P2}} \right)} = {f_{0} + {f_{1}\left\lbrack \frac{{P1} - {P2}}{{P1} + {P2}} \right\rbrack} + {f_{2}\left\lbrack \frac{{P1} - {P2}}{{P1} + {P2}} \right\rbrack}^{2} + {f_{3}\left\lbrack \frac{{P1} - {P2}}{{P1} + {P2}} \right\rbrack}^{3} + \ldots + {f_{n}\left\lbrack \frac{{P1} - {P2}}{{P1} + {P2}} \right\rbrack}^{n}}$

where

λ(P1,P2)=wavelength as a function of detector power ratio (P1−P2)/(P1+P2). It would be possible to convert the given normalized power ratio(P1−P2)/(P1+P2) back to a wavelength λ₁=1309 nm for the first sensor, and λ₂=1306 nm for the second sensor. This determination could be done using either a look-up table derived from the normalized power ratio, or by storing the coefficients of a power series based on the normalized power ratio, and thereafter calculating for wavelength based on this power series.

If the sensors were operating either as temperature sensors or strain sensors, the applied strain or temperature could be computed from the following relationship:

Δλ=α1ΔT+α2 ΔS

where

Δλ=change in sensor wavelength

α1=coefficient of thermal change for sensor

ΔT=change in sensor temperature

α2=coefficient of strain change for sensor

ΔS=change in sensor strain

In this equation, the change in sensor wavelength is expressed as the sum of a temperature related change and a strain related change. The coefficients α1 and α1 would be stored in the controller along with initial condition values to solve for total strain and total temperature. In this manner, any combinations of strain and temperature could be determined given a change in sensor wavelength and the wavelength discriminator characteristic curve, and first and second detector inputs.

FIG. 8 shows a strain/temperature measurement system having a 3-way wavelength discriminator 162. This system is analogous to the system described in FIG. 2, however, for an n-way wavelength discriminator, the output port associated with the excited port has the response shown in plot 186, while the remaining ports have the characteristic shown in plot 188. For example, in the case of FIG. 8, first source 134 sends broadband excitation through first splitter 136, and wave energy at the example grating wavelength λ₁=1300 nm is reflected through splitter 136 to wavelength discriminator port 167. For this case, the output at port 168 has the characteristic shown in plot 186, while the second output 174 and third output 180 have the responses shown by curve 188. For λ₁=1300 nm, the response of the first detector is shown as point 192, while the second the third detectors have the response shown by point 194. As before, a normalized plot of the response of curves 186 and 188 is shown in plot 190. For the case of an n-way wavelength discriminator, the output curve 190 would be ${P({normalized})} = \left\lbrack \frac{{{Pdet}(a)} - \left\{ {{{Pdet}(b)} + {{{Pdet}(c)}\quad \ldots} + {{Pdet}(n)}} \right\}}{{{Pdet}(a)} + \left\{ {{{Pdet}(b)} + {{{Pdet}(c)}\quad \ldots} + {{Pdet}(n)}} \right\}} \right\rbrack$

Where

Pdet(a)=output power from excited channel

Pdet(b) through Pdet(n)=output power from non-excited channel.

A lookup table constructed from the values of curve 190 would produce the value for λ₁=1300 nm as shown at point 196. Similarly, when second source 144 excites grating 150, wave energy at the exemplar wavelength λ₂=1305 nm would return through splitter 146, fiber 173, and now fiber 174 would contain the response shown in plot 186. Fibers 168 and 180 would contain wave energy shown in plot 188, corresponding to point 200. The normalized power ratio for λ₂=1305 nm is represented by point 204 of the plot 190. The case where third source 154 excites grating 160 is shown in third detector response 186, and first and second detector responses 188. For the case where third grating wavelength is 1310 nm, the responses of the third detector, first and second detectors, and normalized power ratio are shown in points 206, 208, and 210. It is clear to one skilled in the art that this system is extendable to n ports of measurement, where each port has a source, a splitter, and each splitter port is connected to an input port of an n-way wavelength discriminator. Each output port of the n-way wavelength discriminator is coupled to a detector, and the response of each detector is measured, and the normalized power ratio is formed from the ratio of the difference between the response of an excited port and the responses of all of the non-excited ports, divided by the sum of all of the responses of excited and non-excited ports.

FIG. 10 shows a strain/temperature sensor system 211 attached to a fiber 220 comprising a plurality of gratings 224, 226, and 230. These sensors operate as earlier described, but are sequentially applied to various parts of a fiber 220. Each sensor 224, 226, and 230 reflects wave energy at respective unique wavelengths λ₁, λ₂, and λ_(n). Since gratings 224 and 226 have no effect on out-of-band waves at λ_(n), splitter 218 delivers to fiber 268 the superposition of reflected unique wavelengths λ₁ through λ_(n). Wavelength separator 236 has broadband outputs which respond only to the range of reflected wavelengths for that given output. For example, output 235 is responsive only to the range of λ₁, and output 243 is only responsive to the range of λ₂, and output 249 is only responsive to the range of λ_(n), This requires that the sensor wavelengths and wavelength separator characteristics be chosen such that isolated response of a given wavelength separator to a given sensor grating wavelength occur. In this manner, output 235 represents exclusively the range of wavelengths of sensor 224, output 243 represents exclusively the range of wavelengths of sensor 226, and output 249 represents exclusively the range of wavelengths of sensor 230. The conversion of the outputs of separator 236 into a detected wavelength occurs as was earlier described in FIGS. 4, 5, and 6. In this manner, multiple sensors can share a single fiber, as long as each produces a unique wavelength.

An alternate wavelength measurement apparatus 318 is shown in FIG. 11, which performs the same function as 270 of FIG. 10. While the wavelength measurement apparatus 270 uses a wavelength separator 236 followed by narrowband wavelength discriminators 234, 242, and 248, the wavelength measurement apparatus 318 of FIG. 11 utilizes a broadband wavelength discriminator 316 followed by wavelength separators 312 and 314. These produce complimentary outputs 296 and 304 for λ₁, complimentary outputs 298 and 306 for λ₂, and complimentary outputs 300 and 308 for λ_(n), Detectors 232, 240, 246, 238, 244, and 250 operate in a manner identical to those of FIG. 10.

FIG. 12 shows a measurement system 340 connected to fiber 350, which has a series of sensors 352, 354, and 358, which operate the same as those described earlier in FIG. 10. A single broadband source excites fiber 350 through splitter 348. Splitter 348 returns aggregate reflected waves from sensors 352, 354, and 358 on fiber 356. A series of tunable filters 362, 364, and 368 is coupled to detector 360. Each of these filters is tuned over a narrow range through the application of a control voltage 372, 374, and 378. In operation, filters 364 and 368 have a voltage applied which reflects wave energy out of the range reflected by the sensors 354 and 358, enabling the passage of waves reflected by sensor 352 to pass through and on to tunable filter 362. Tunable filter 362 is swept over its tuning range, and produces a minimum output at detector 360 at the point where the grating 352 matches the tuned filter 362. Controller 380 has the characteristic of tunable filter 362 stored in memory such that the voltage 372 producing a minimum detected output 370 enables the extraction of corresponding wavelength for λ₁, Next, tunable filters 362 and 368 are tuned out of the band of grating 352 and 358, and tunable filter 364 is swept over its range until a detector minimum is found. As earlier, this minimum voltage corresponds to the wavelength λ₂. This process continues for as many sensor gratings and tunable filters that are present in the system. In practice, there are many ways of fabricating tunable gratings, including the application of a material with an index of refraction which varies with an applied voltage, the application of a tensile force to a fiber having a grating, or the application of a magnetic field to a grating in close proximity to a material having an index of refraction which changes with an applied magnetic field. It should be clear to one skilled in the art that there are many different ways of practicing such tunable filters, wherein an applied control voltage changes the wavelength of reflection of the tunable filter.

FIG. 13 shows the waveforms for the system of FIG. 12. Tunable filter control voltage points 390, 392, and 394 correspond to the detector minima 396, 398, and 400 shown, and therefore enable the recovery of sensor wavelengths λ₁, λ₂, and λ_(n).

While the foregoing description is drawn to specific implementations, it is clear to one skilled in the art that other embodiments are available. For example, the earlier described functions SUM and DIFF, which relate to the normalized power ratio, could be implemented using operational amplifiers computing these measurements as analog values, or they could be implemented digitally, operating on digitized detector values. These converters could be either integral to the microprocessor, or external, and the sum and difference values could either be computed through direct reading of the values of the detectors, or through reading sum and difference voltages of alternate circuitry. While the multiple sensor system of FIGS. 10 and 12 are drawn to a 3 sensor system, it is clear to one skilled in the art that these could be drawn to arbitrary numbers of channels operating as strain sensors, temperature sensors, or both. There are also many ways of extracting sensor wavelength from the systems described. For clarity, time division processing has been shown, wherein at a particular time, only a single channel of the system is active, and only one particular wavelength value is recovered. In addition to the explicitly described method of time division processing, there are many modulation schemes wherein each of the sensor values is modulated in frequency or amplitude, and later demodulated to recover the desired value. In this manner, all of the channels of the system could operate simultaneously, rather than sequentially. The use of specific examples for illustration and understanding of the operation of the system does not imply an exclusive manner in which these systems could be implemented.

FIG. 14 shows a strain/temperature measurement system 20 similar to that of FIG. 2, but with a different wavelength discriminator. In the alternate embodiment of FIG. 14, the elements having the same numbering as those of FIG. 2 perform the same function as earlier described, but the wavelength discriminator now comprises third splitter 400 which has as inputs the previously described fibers 41 and 43, and has a normalizing output 406 which is wavelength-invariant compared to wavelength determining output 405. The wavelength-determining output 405 is formed from broad-bandwidth grating 404, which has an output amplitude varying with wavelength over the tuning range of the sensor gratings, as will be described later. First detector 408 and second detector 410 accept optical inputs 405 and 406, respectively, and produce electrical outputs 412 and 414 which are proportional to the respective optical inputs 405 and 406.

FIG. 15 shows the controller 401 of FIG. 14, which is similar to the controller of FIG. 3, and has similarly-functioning elements numbered the same as those of FIG. 3, as was described earlier. First detector output 412 drives buffer 416 and produces output 420, which is digitized by analog-digital converter 424 and is presented as a digital input 428 to microprocessor 78. Second detector output 414 drives buffer 418 to produce signal 422 which is converted to a digital input 430 by analog-digital converter 426 and delivered to microprocessor 78.

FIG. 16 shows the characteristic response of the wavelength discriminator having a normalizing input 406, represented by response curve 464, and wavelength-determining input 405, represented by response curve 450. As the reflected wave from grating 46 or grating 52 passes through third splitter 400, equal amounts of energy are presented into grating 404, and to normalizing input 406. As the wavelength applied to third splitter 400 is varied, normalizing output 406 follows the response of curve 464, while the wavelength-determining input 405 follows the response of curve 450, in accordance with the characteristic response of broadly tuned grating 404, whose characteristics are chosen to include a monotonic region from first discrimination wavelength 452 to final discrimination wavelength 454. In the case where grating 46 is reflecting a wavelength of 1306 nm, curve 460 represents the spectral energy of reflected energy from grating 46, which is applied to curve 460 to produce an output of approximately 1.0 units. This same reflected response 456 applied to grating 404 having the response of curve 450 and produces an output of approximately 0.25 units. As can be seen from FIG. 16, as long as the range of input wavelength is between first discrimination wavelength 452 and final discrimination wavelength 454, it is possible to recover the wavelength from curve 450. By using the ratio of response 450 to response 464, the effect of intensity variations in first source 36 and second source 40 is removed, as was discussed for the system of FIG. 2. By keeping a copy of the characteristic curve of this normalized function of curve 450 divided by curve 464 in the microprocessor 78, it is possible to resolve any input wavelength in the range first discrimination wavelength 452 to final discrimination wavelength 454 when given the first detector output 412 and second detector output 414. As described earlier, this determination can be made by storing the response of curves 450 and 452 in a look-up table, or by specifying the curve as the coefficients of a polynomial, or in many other ways, all of which form representations of the characteristic curves of 450 or the ratio of curve 450 divided by curve 452.

FIG. 17 shows another embodiment 503 of a temperature/strain sensor comprising the old elements of FIG. 2 with a new wavelength discriminator circuit. This new wavelength discriminator comprises third splitter 470, fourth splitter 488, a coarse wavelength discriminator 474, and a fine wavelength discriminator 492, coarse wavelength first and second detectors 478 and 484, and fine wavelength discriminator first and second detectors 504 and 498. The operation of the coarse wavelength discriminator comprising coarse wavelength discriminator 474, first detector 478, and second detector 484 is similar to that described in FIGS. 4, 5, and 6, and has a usable wavelength range matched to that of the sensor grating operating range. However, in addition to the coarse wavelength discriminator, a fine wavelength discriminator comprising fine wavelength discriminator 492, and first detector 504 and second detector 498 are used. Third splitter 470 and fourth splitter 488 produce the signals for simultaneous delivery to the coarse and fine wavelength discriminators, as all 4 detectors are used simultaneously, although as described earlier, the first source 36 and second source 40 operate during different intervals, or have orthogonal modulation functions which enable the discrimination of the two detector outputs through the use of a modulation function applied to the sources and a demodulation function applied to the detectors.

FIG. 18 shows the details of the fine and coarse wavelength discriminators. Curves 516 and 510 represent the optical response of the wavelength discriminator, as measured at fibers 476 and 482, as well as the detected electrical responses of 480 and 486 to changes in wavelength of sensor 46 or 52, all of which function as earlier described in the system of FIG. 2. For the case of sensor 46 reflecting optical energy at 1302 nm, fiber 472 carries optical wave energy which is provided to coarse wavelength discriminator 474. First output optical fiber 476 carries the energy of curve 512, while second output optical fiber 482 carries the energy of curve 514. Fine wavelength discriminator 492 has many more cycles in the same monotonic range of coarse wavelength discriminator 474, as is seen by the periodicity of curves 510 and 516 of the coarse wavelength discriminator, compared to curves 522 and 524 of the fine wavelength discriminator. The monotonic curve of 510 and 516 is necessary over the tuning range of the reflecting gratings 46 and 52 to ensure single-wavelength resolution. The multiple cycles of discriminator 522 and 524 enable the more precise measurement of wavelength when used in combination with the coarse wavelength discriminator 474. Fine wavelength discriminator is fed by fiber 491, and has a first output 502 which carries the energy of curve 522 and a second output 496 which carries the energy of curve 524 when excited by the signal of fiber 491. When the input signal is provided by fiber 493, the characteristic of the first and second outputs reverse, as was described earlier in FIGS. 4, 5, and 6. In this manner, sensor 46 reflecting a 1302 nm wavelength produces a first coarse detector response of 512, a second coarse detector response of 514, a first fine detector response of 526, and a second fine detector response of 528. Sensor 52 reflecting a wavelength of 1311 nm produces a first coarse detector response of 518, a second coarse detector response of 520, a first fine detector response of 532, and a second fine detector response of 530. As is clear to one skilled in the art, any combination of curve storage methods for maintaining the characteristic curves of 510, 516, 522, and 524 or the difference divided by the sum of curves 510 to 516, or curves 522 and 524 could be stored using the previously described look-up tables, polynomial coefficients, or interpolated points for use by the microprocessor 78 of the controller 501 of FIG. 17. 

We claim:
 1. A fiber-optic sensor system comprising: a plurality n of narrow band sensor gratings, each reflecting optical energy at a unique wavelength λn, and arranged in a series configuration having a single sensor port; an optical splitter having a source port, a filter port, and a sensor port, wherein optical energy applied to said sensor port is divided between said source port and said filter port, and wherein optical energy applied to said source port travels to said sensor port, said splitter sensor port coupled to said single sensor port; an optical source providing optical power which includes at least the spectral bandwidth of each of said n sensor wavelengths, said optical source coupled to said optical splitter source port, and said optical source having an enable input; a wavelength measurement apparatus having an input and a plurality of complimentary detector output pairs, each of said complimentary detector output pairs responsive to one of said sensor grating wavelengths, said wavelength measurement apparatus input coupled to said optical splitter filter port; a controller enabling said optical source and examining each of said wavelength measurement apparatus complimentary detector outputs, said controller having a stored relationship between a given complimentary detector output and a wavelength, and said controller using said stored relationship to determine said wavelength for each complimentary detector output pairs.
 2. The sensor system of claim 1 wherein said wavelength measurement apparatus further comprises a wavelength separator having an input and a plurality of n outputs, each of said n outputs responsive to one of said n sensor wavelengths, said wavelength separator input coupled to said wavelength measurement apparatus input; a plurality n of wavelength discriminators, each having an input, a first detector output, and a second detector output, wherein optical energy applied to said input divides between said first detector output and said second detector output in a manner related to the wavelength of said optical energy, and where the sum of said first detector output and said second detector output remains constant over the range of said applied wavelengths; each of said wavelength discriminator inputs coupled to each of said wavelength separator outputs, and each of said wavelength discriminator first and second outputs coupled to detectors and producing said wavelength measurement apparatus detector complimentary outputs.
 3. The sensor of claim 2 wherein said controller determines the wavelength of each of said sensors by comparing said first detector and said second detector response to a stored copy of said wavelength discriminator characteristic which relates wavelength to said detector response.
 4. The sensor of claim 3 wherein said comparison uses a normalized power ratio formed by dividing the difference of said first detector output and said second detector output by the sum of said first detector output and said second detector output.
 5. The sensor of claim 4 wherein said normalized power ratio to wavelength relationship is stored in a look-up table.
 6. The sensor of claim 4 wherein said normalized power ratio to wavelength relationship is stored in the form of the coefficients of a power series.
 7. The sensor of claim 5 or 6 wherein said comparison values are modified though the removal of offset values for said first detector and said second detector.
 8. The sensor of claim 5 or 6 wherein said sensor gratings measure temperature.
 9. The sensor of claim 5 or 6 wherein at least one of said sensor gratings measures temperature and at least one of said sensor gratings measures strain.
 10. The sensor system of claim 1 wherein said wavelength measurement apparatus further comprises a wavelength discriminator having an input, a first output, and a second output, wherein optical energy applied to said input splits between said first output and said second output in a manner related to the wavelength of said optical energy, and where the sum of said wavelength discriminator first output and said wavelength discriminator second output remains constant over the range of said applied wavelengths; a first and a second wavelength separator, each having an input and a plurality of n outputs, each of said n outputs responsive to one of said n sensor wavelengths; said first wavelength separator input coupled to said first wavelength discriminator output, and said second wavelength separator input coupled to said second wavelength discriminator output; each of said first wavelength separator outputs and said second wavelength separator outputs responsive to a single said sensor wavelength coupled to a detector responsive to said separator output wave energy, each pair of said detectors forming said wavelength measurement apparatus complimentary detector output pairs.
 11. The sensor of claim 10 wherein said controller determines the wavelength of each of said sensors by comparing said complimentary detector output pair responses to a stored copy of said wavelength discriminator characteristic which includes the relationship between said complimentary output pair responses and a wavelength.
 12. The sensor of claim 11 wherein said comparison uses a normalized power ratio formed by dividing the difference of said first detector output and said second detector output by the sum of said first detector output and said second detector output.
 13. The sensor of claim 12 wherein said normalized power ratio to wavelength relationship is stored in a look-up table.
 14. The sensor of claim 13 wherein said normalized power ratio to wavelength relationship is stored in the form of the coefficients of a power series.
 15. The sensor of claims 13 or 14 wherein said comparison values are modified though the removal of offset values for said first detector and said second detector.
 16. The sensor of claims 13 or 14 wherein at least one of said sensors measure temperature.
 17. The sensor of claims 13 or 14 wherein at least one of said sensors measures strain.
 18. A fiber-optic sensor system comprising: a plurality n of narrow band sensor gratings, each reflecting optical energy at a unique wavelength λn, and arranged in a series configuration having a single sensor port; an optical-splitter having a source port, a filter port, and a sensor port, wherein optical energy applied to said sensor port is divided between said source port and said filter port, and wherein optical energy applied to said source port travels to said sensor port, said single sensor port coupled to said splitter sensor port; an optical source providing optical power which includes at least the spectral bandwidth of said n sensor wavelengths, said optical source coupled to said optical splitter source port; a wavelength detection apparatus having an input port coupled to an output port through a plurality n of tunable filters in series configuration, each of said tunable filters having a tuning range which is greater than the sensor wavelength range of each of said sensor gratings, and said wavelength detection input port coupled to said optical splitter filter port, said wavelength detection output port coupled to a detector having an output proportional to an input optical amplitude; a controller measuring said detector output while varying said tunable filters until a minimum detector response is found.
 19. The sensor system of claim 18 wherein each of said tunable filters is controlled by a tunable filter control voltage which is varied by said controller such that only one said tunable filter has a varying control voltage applied at a time, while the other said tunable filters have a fixed voltage applied during the measurement interval.
 20. The sensor system of claim 18 wherein said tunable filters are controlled by a tunable filter control voltage which is varied by said controller such that more than one said tunable filter control voltage is varied during the measurement interval.
 21. The sensor of claim 18 wherein said controller determines the wavelength of each of said sensors by comparing said tunable filter control voltage which produces said detector minimum response to a stored copy of the relationship between said tunable filter output voltage and said wavelength.
 22. The sensor of claim 20 wherein said controller determines the wavelength of each of said sensors by comparing said detector minimum response when said tunable filter control voltage is applied to a stored copy of the relationship between said tunable filter control voltage and said wavelength.
 23. The sensor of claim 21 wherein said relationship between said tunable filter control voltage and said wavelength is stored in a look-up table.
 24. The sensor of claim 21 wherein said relationship between said tunable filter control voltage and said wavelength is stored in the form of the coefficients of a power series.
 25. The sensor of claim 19 or 20 wherein at least one of said sensors measures temperature.
 26. The sensor of claim 19 or 20 wherein at least one of said sensors measures strain. 